On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.
Metrics
Affected Vendors & Products
References
History
Fri, 05 Sep 2025 18:15:00 +0000
| Type | Values Removed | Values Added |
|---|---|---|
| Metrics |
ssvc
|
Fri, 05 Sep 2025 17:30:00 +0000
| Type | Values Removed | Values Added |
|---|---|---|
| Description | On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible. | |
| Title | NRF52810 Runtime EM Fault Injection APPROTECT Bypass | |
| Weaknesses | CWE-1191 CWE-1319 |
|
| References |
|
|
| Metrics |
cvssV4_0
|
Status: PUBLISHED
Assigner: Toreon
Published: 2025-09-05T17:16:16.345Z
Updated: 2025-09-05T18:07:49.930Z
Reserved: 2025-08-29T16:27:34.512Z
Link: CVE-2025-9709
Updated: 2025-09-05T18:07:43.143Z
Status : Awaiting Analysis
Published: 2025-09-05T18:15:50.927
Modified: 2025-09-08T16:25:38.810
Link: CVE-2025-9709
No data.