Memory corruption while handling test pattern generator IOCTL command.
Metrics
Affected Vendors & Products
References
History
Wed, 20 Aug 2025 20:30:00 +0000
| Type | Values Removed | Values Added |
|---|---|---|
| First Time appeared |
Qualcomm
Qualcomm sdm429w Qualcomm sdm429w Firmware Qualcomm snapdragon 429 Mobile Platform Qualcomm snapdragon 429 Mobile Platform Firmware Qualcomm wcn3620 Qualcomm wcn3620 Firmware Qualcomm wcn3660b Qualcomm wcn3660b Firmware |
|
| CPEs | cpe:2.3:h:qualcomm:sdm429w:-:*:*:*:*:*:*:* cpe:2.3:h:qualcomm:snapdragon_429_mobile_platform:-:*:*:*:*:*:*:* cpe:2.3:h:qualcomm:wcn3620:-:*:*:*:*:*:*:* cpe:2.3:h:qualcomm:wcn3660b:-:*:*:*:*:*:*:* cpe:2.3:o:qualcomm:sdm429w_firmware:-:*:*:*:*:*:*:* cpe:2.3:o:qualcomm:snapdragon_429_mobile_platform_firmware:-:*:*:*:*:*:*:* cpe:2.3:o:qualcomm:wcn3620_firmware:-:*:*:*:*:*:*:* cpe:2.3:o:qualcomm:wcn3660b_firmware:-:*:*:*:*:*:*:* |
|
| Vendors & Products |
Qualcomm
Qualcomm sdm429w Qualcomm sdm429w Firmware Qualcomm snapdragon 429 Mobile Platform Qualcomm snapdragon 429 Mobile Platform Firmware Qualcomm wcn3620 Qualcomm wcn3620 Firmware Qualcomm wcn3660b Qualcomm wcn3660b Firmware |
Tue, 03 Jun 2025 14:15:00 +0000
| Type | Values Removed | Values Added |
|---|---|---|
| Metrics |
ssvc
|
Tue, 03 Jun 2025 06:00:00 +0000
| Type | Values Removed | Values Added |
|---|---|---|
| Description | Memory corruption while handling test pattern generator IOCTL command. | |
| Title | Use of Out-of-range Pointer Offset in Camera Driver | |
| Weaknesses | CWE-823 | |
| References |
| |
| Metrics |
cvssV3_1
|
Status: PUBLISHED
Assigner: qualcomm
Published: 2025-06-03T05:52:50.844Z
Updated: 2025-06-03T13:32:03.256Z
Reserved: 2024-11-19T01:01:57.501Z
Link: CVE-2024-53017
Updated: 2025-06-03T13:31:58.177Z
Status : Analyzed
Published: 2025-06-03T06:15:24.793
Modified: 2025-08-20T20:24:55.310
Link: CVE-2024-53017
No data.